Sensitivity estimation of indium oxide thin film for gamma sensing

نویسندگان

چکیده

Abstract This article aims to study the modification in structural, optical and electrical properties of indium oxide thin film after gamma irradiation estimation sensitivity for sensing applications. The was deposited on a 450 °C preheated glass substrate using spray pyrolysis technique. molar concentration 0.15 M thickness around 600 nm irradiated with different doses (100 Gy, 200 300 Gy 400 Gy). are studied UV–Visible spectroscopy. Transmittance increased up beyond that, it decreased. Indium is an n -type semiconductor which exhibits both direct indirect transitions. Both bandgap energy calculated Tauc’s plot. Extinction coefficient refractive index variation were also estimated. Photoluminescence confirmed gamma-induced defect formation annihilation dose respectively. Resistivity decreased increased. estimated from measurements, lies between 10.7 53.4 mA/cm 2 /Gy. Graphical abstract

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ژورنال

عنوان ژورنال: Journal of Materials Science

سال: 2023

ISSN: ['1573-4803', '0022-2461']

DOI: https://doi.org/10.1007/s10853-023-08720-z